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GAL16V8解密(破解)

    GAL16V8芯片解密是芯谷芯片解密在Lattice系列IC芯片解密领域涉及的典型IC型号,芯谷长期专注于各类IC解密、DSP芯片解密、CPLD芯片解密、MCU单片机解密、FLASH单片机解密、掩膜IC芯片解密等技术研究领域,依靠多年来的技术研究成果和实际解密经验积累,目前,芯谷科技针对Lattice系列多种型号芯片均能提供安全可靠、价格合理的解密方案。
    有GAL16V8解密(破解)等Lattice系列IC芯片解密需求者欢迎与芯谷芯片解密研究所联系,
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    这里,我们提供对GAL16V8芯片的基本性能特征介绍,供客户及技术工程师参考借鉴。
    关于GAL16V8芯片
  The GAL16V8, at 3.5 ns maximum propagation delay time, combines a high performance CMOS process with Electrically Erasable(E2) floating gate technology to provide the highest speed performance available in the PLD market. High speed erase times(<100ms) allow the devices to be reprogrammed quickly and efficiently.The generic architecture provides maximum design flexibility by allowing the Output Logic Macrocell (OLMC) to be configured by the user. An important subset of the many architecture configurations possible with the GAL16V8 are the PAL architectures listed in the table of the macrocell description section. GAL16V8 devices are capable of emulating any of these PAL architectures with full function/fuse map/parametric compatibility.
  Unique test circuitry and reprogrammable cells allow complete AC,DC, and functional testing during manufacture. As a result, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified.
  GAL16V8 Features
  HIGH PERFORMANCE E2CMOS? TECHNOLOGY
  — 3.5 ns Maximum Propagation Delay
  — Fmax = 250 MHz
  — 3.0 ns Maximum from Clock Input to Data Output
  — UltraMOS? Advanced CMOS Technology
  50% to 75% REDUCTION IN POWER FROM BIPOLAR
  — 75mA Typ Icc on Low Power Device
  — 45mA Typ Icc on Quarter Power Device
  ACTIVE PULL-UPS ON ALL PINS
  E2 CELL TECHNOLOGY
  — Reconfigurable Logic
  — Reprogrammable Cells
  — 100% Tested/100% Yields
  — High Speed Electrical Erasure (<100ms)
  — 20 Year Data Retention
  EIGHT OUTPUT LOGIC MACROCELLS
  — Maximum Flexibility for Complex Logic Designs
  — Programmable Output Polarity
  — Also Emulates 20-pin PAL? Devices with Full Function/Fuse Map/Parametric Compatibility
  PRELOAD AND POWER-ON RESET OF ALL REGISTERS
  — 100% Functional Testability
  APPLICATIONS INCLUDE:
  — DMA Control
  — State Machine Control
  — High Speed Graphics Processing
  — Standard Logic Speed Upgrade
  ELECTRONIC SIGNATURE FOR IDENTIFICATION
 

[来源:芯片解密研究所] [作者:admin] [日期:09-11-04] [热度:]

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